If you have any questions regarding capabilities at ePSIC please contact a member of staff.
E03: JIB 4700F Focused Ion Beam microscope
- Multi beam system consisting of an electron beam and gallium ion beam.
- Detectors; in-chamber ETD, in-column backscatter, backscatter topographical, backscatter compositional, in-column secondary.
- Slice and view imaging to give volumetric information.
- Ex-situ lift out system, for lifting out a lamella onto a TEM holder