Spaces
Apps
Templates
Create
ePSIC Documentation
All content
Space settings
Content
Results will update as you type.
•
ePSIC Instruments
Guidelines
User manuals
Calibrations
•
60keV Convergence Semi-angles
•
60keV Detector semi-angles
•
60keV STEM beam current
•
60keV TEM Beam current
•
80keV Convergence semi-angles
•
80keV Detector semi-angles
•
80keV STEM beam currents
•
80keV TEM beam current
•
200keV Convergence semi-angles
•
200keV Detector semi-angles
•
300keV TEM beam current
•
300 keV STEM beam current
•
300keV TEM Cc and defocus per bit
•
300keV Detector semi-angles
•
300keV Convergence semi-angles
•
300keV STEM Mag Calibrations (E02)
E01- 80 kV STEM
E01- 200 kV STEM
•
E02 300kV - Oxford Instruments k factors
•
E01 Digital Micrograph k-factors (200kV)
Software
How-to articles
HyperSpy Workshop- 2018
Hyperspy Workshop- 2019
•
Hyperspy Workshop- 2020
•
Hyperspy Workshop- 2021
•
Hyperspy Workshop- 2022
•
Hyperspy Workshop- 2023
•
Hyperspy Workshop- 2024
ePSIC Documentation
/
Calibrations
/
E01 Digital Micrograph k-factors (200kV)
Summarize
E01 Digital Micrograph k-factors (200kV)
qzo13262 (Unlicensed)
Owned by
qzo13262 (Unlicensed)
Mar 07, 2019
1 min read
Loading data...
{"serverDuration": 13, "requestCorrelationId": "a51f58ae7f774462a89f2fd780b7acf8"}